A research team has developed a high-resolution imaging method based on extreme short-wave UV light. It can be used to examine internal structures in semiconductors non-destructively, and with nanometer precision.
from Latest Science News -- ScienceDaily https://www.sciencedaily.com/releases/2021/02/210216133430.htm
from Latest Science News -- ScienceDaily https://www.sciencedaily.com/releases/2021/02/210216133430.htm
A sharper look at the interior of semiconductors
![A sharper look at the interior of semiconductors]()
Reviewed by cmakigo
on
February 17, 2021
Rating:
No comments:
Post a Comment